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Current probes, more useful than you think

Year: 2002

Type: conference-paper

Source: IEEE International Symposium on Electromagnetic Compatibility

DOI: 10.1109/isemc.1998.750102

Author: D.C. Smith

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1705232284

FWCI: 1.067

Cites: 1

Cited by: 26

Related to: 10