ESD characterization of atomically-thin graphene
Year: 2012
Type: conference-paper
Authors: Hong Li, Christian Russ, Wei Liu, David Johnsson, Harald Goßner, Kaustav Banerjee
Institutions: University of California, Santa Barbara, Intel (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1747631579