Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges
Year: 2011
Type: article
Abstract: We show that high-resolution Resonant Inelastic X-ray Scattering (RIXS) provides direct, element-specific and momentum-resolved information on the electron-phonon (e-p) coupling strength. Our theoretical analysis indicates how the e-p coupling can be extracted from RIXS spectra by determining the differential phonon scattering cross-section. An alternative manner to extract the coupling is to use the one- and two-phonon loss ratio, which is governed by the e-p coupling strength and the core-hole lifetime. This allows the determination of the e-p coupling on an absolute energy scale.
Source: Europhysics Letters (EPL)
Authors: L. J. P. Ament, M. van Veenendaal, J. van den Brink
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
Awards: G102163711, G107546177, G1286251239, G1313983767, G1664757510, G2186052798, G222768804, G2371548206, G262962599, G303061748, G3075337988, G426311843, POLARIZED X-RAYS AS A PROBE OF SPIN POLARIZATION AND INTERFACE AND CONFINEMENT EFFECTS: A THEORETICAL APPROACH, G5387317844, G5570207115, G5648016710, BUILDING A UNIFIED COMPUTATIONAL MODEL FOR THE RESONANT X-RAY SCATTERING OF STRONGLY CORRELATED MATERIALS, G618388848, G6550344761, G6848031779, G7283024673, G7583137537, G8245637206, G911061179, G969889393
OpenAlex ID: W1797734130