Work

Phylogenetic confidence intervals for the optimal trait value

Year: 2015

Type: article

Abstract: We consider a stochastic evolutionary model for a phenotype developing amongstnrelated species with unknown phylogeny. The unknown tree is modelled by a Yule process conditioned onncontemporary nodes. The trait value is assumed to evolve along lineages as an Ornstein-Uhlenbeck process. As a result, the trait values of thenspecies form a sample with dependent observations. We establish three limit theorems for the sample mean corresponding to three domains for the adaptation rate. In the case of fast adaptation, we show that for largenthe normalized sample mean is approximately normally distributed. Using these limit theorems, we develop novel confidence interval formulae for the optimal trait value.

Source: Journal of Applied Probability

DOI: 10.1239/jap/1450802756

Authors: Krzysztof Bartoszek, Serik Sagitov

Institutions: Uppsala University, Chalmers University of Technology, University of Gothenburg

Language: English

Topic: Stochastic processes and statistical mechanics

Subfield: Mathematical Physics

Field: Mathematics

Domain: Physical Sciences

Open Access status: bronze

Funders: Royal Swedish Academy of Sciences, Vetenskapsrådet, Göteborgs Universitet, Division of Mathematical Sciences

Award: G6902132488