Work

Automatic physical phasing X-ray crystallography

Year: 2004

Type: preprint

Abstract: Phase invariants are important pieces of information about the atomic structures of crystals. There are several mathematical methods in X-ray crystallography to estimate phase invariants. The multi-wave diffraction phenomenon offers a unique opportunity of physically measuring phase invariants. In this work, the underneath principals for developing an automatic procedure to extract accurate phase-invariant values are described. A general systematic procedure is demonstrated, in practice, by analyzing intensity data from a KDP crystal.

Source: arXiv (Cornell University)

DOI: 10.48550/arxiv.cond-mat/0409487

Authors: Morelhão, Sérgio L., Avanci, Luis H., Kycia, Stefan

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1837718261

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