Work

X-ray reflectivity determination of interface roughness and correlated with magnetic coercivity of Co/sub 82/Cr/sub 12/Pt/sub 4/Ta/sub 4/ thin film

Year: 2005

Type: conference-paper

Source: IEEE International Magnetics Conference

DOI: 10.1109/intmag.2000.871842

Authors: Ding Jin, JianPping Wang, Hao Gong

Institutions: Data Storage Institute, National University of Singapore

Language: English

Topic: Magnetic properties of thin films

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1841428244

FWCI:

Cites: 2

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Related to: 10