Work

Quantitative Fault Analysis on Pencil Case using Image Processing

Year: 2014

Type: conference-paper

Source: International Conference on Information and Communication Technologies

Authors: K V Santhosh, Bhagya R. Navada

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1848900763

FWCI:

Cites: 19

Cited by:

Related to: 10