Work

Electrical stability of multilayer MoS2 field-effect transistor under negative bias stress at various temperatures

Year: 2014

Type: article

Source: physica status solidi (RRL) - Rapid Research Letters

DOI: 10.1002/pssr.201409146

Authors: Suk Yang, Solah Park, Sukjin Jang, Hojoong Kim, Jang-Yeon Kwon

Institution: Yonsei University

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1849445681

FWCI: 1.787

Cites: 29

Cited by: 44

Related to: 10