Work

Memory Effects in an AMS System: Catastrophe and Recovery

Year: 1990

Type: article

Abstract: A sample with a 14C concentration estimated to be greater than 30,000 Modern was inadvertently graphitized and measured in an AMS system. No measurable contamination of the cesium sputter ion source was observed. Simple cleaning procedures removed the contamination from the sample preparation system, with the exception of the reaction vessel in which the sample was graphitized. Sample cross-contamination factors were estimated for all of the preparation and measurement procedures.

Source: Radiocarbon

DOI: 10.1017/s0033822200039965

Authors: J S Vogel, J R Southon, D E Nelson

Institution: Simon Fraser University

Language: English

Topic: Archaeology and ancient environmental studies

Subfield: Paleontology

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: bronze

Funders: McMaster University, Natural Sciences and Engineering Research Council of Canada

OpenAlex ID: W1855515607