Work

General and Special Probes in Scanning Microscopies

Year: 2011

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-3-642-15283-2_3

Authors: Jason Hafner, Edin Chen, Ratnesh Lal, Sungho Jin

Institutions: Rice University, National Central University, University of California System, University of California San Diego

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1866351979

FWCI: 1.185

Cites: 51

Cited by: 2

Related to: 10