A new background correction method in X-ray phase contrast imaging with Talbot-Lau interferometer
Year: 2015
Type: preprint
Abstract: X-ray Talbot-Lau interferometer has been used widely to conduct X-ray phase contrast imaging with a conventional low-brilliance X-ray source. Typically, in this X-ray phase contrast imaging technique, a background correction process has to be performed in order to obtain the pure signal of the sample. In this manuscript, we reported on an experimental research on the background correction strategies within this X-ray imaging technique, especially we introduced a new way to perform background correction, the key point of this new method is changing the initial phase of each pixel by a cyclic shift operation on the raw images collected by phase stepping scan. Experimental result and numerical analysis show that this new method could successfully realize background correction without error, moreover, a potential advantage of this new method is that its effective phase measuring range could be tuned flexibly in some degree for example to (-{\pi}+3, {\pi}+3], thus it would find potential advantage in certain case because measuring range of the conventionally widely used method is fixed to (-{\pi}, {\pi}].
Source: arXiv (Cornell University)
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1871963288