Work

Effects of Li doping on the negative bias stress stability of solution-processed ZnO thin film transistors

Year: 2015

Type: article

Source: RSC Advances

DOI: 10.1039/c5ra11480b

Authors: Bokyung Kim, Si Yun Park, Jieun Ko, Young-Jae Kim, Youn Sang Kim

Institutions: Seoul National University, Advanced Institute of Convergence Technology

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1877908350

FWCI: 0.155

Cites: 28

Cited by: 5

Related to: 10