Work

A self-calibrating barrier-detector microsystem in standard silicon circuit technology

Year: 2002

Type: conference-paper

Source: IEEE International Symposium on Industrial Electronics (ISIE)

DOI: 10.1109/isie.1995.497300

Authors: C. Kuratli, Q. Huang, O. Brand, H. Baltes

Institutions: ETH Zurich, Integrated Systems Laboratory

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1901434970

FWCI: 0.356

Cites: 2

Cited by: 5

Related to: 10