Work

High Spatial Resolution Mapping Of Defects In Direct And Indirect Gap Semiconductors

Year: 2005

Type: conference-paper

Source: IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS)

DOI: 10.1109/leos.1990.690700

Author: G.E. Carver

Institution: AT&T (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1913370389

FWCI:

Cites: 5

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Related to: 10