Year: 2004
Type: article
Abstract: Ferroelectric BiFeO3 thin films have been deposited on Pt/TiO2/SiO2/Si substrate by pulsed-laser deposition. From the X-ray diffraction analysis, the BiFeO3 thin film consists of perovskite single-phase, and the crystal structure shows the tetragonal structure (c/a = 1.018) with a space group P4m m. It is obtained that the BiFeO3 thin film shows a well-saturated remarkably giant saturation polarization of 158 µC/cm2 and a remanent polarization of 146 µC/cm2 for a maximum applied voltage of 20 V at 90 K. These values of polarization are largest ever-measured in ferroelectrics.
DOI: 10.1143/jjap.43.l647
Institution: The University of Osaka
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1925339558
