Year: 2010
Type: preprint
Abstract: In this paper we describe a measurement technique capable of resolving femtosecond X-ray pulses from XFEL facilities. Since these ultrashort pulses are themselves the shortest event available, our measurement strategy is to let the X-ray pulse sample itself. Our method relies on the application of a "fresh" bunch technique, which allows for the production of a seeded X-ray pulse with a variable delay between seed and electron bunch. The shot-to-shot averaged energy per pulse is recorded. It turns out that one actually measures the autocorrelation function of the X-ray pulse, which is related in a simple way to the actual pulse width. For implementation of the proposed technique, it is sufficient to substitute a single undulator segment with a short magnetic chicane. The focusing system of the undulator remains untouched, and the installation does not perturb the baseline mode of operation. We present a feasibility study and we make exemplifications with typical parameters of an X-ray FEL.
Source: arXiv (Cornell University)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1943262160