Work

Patent citation indicators: One size fits all?

Year: 2015

Type: article

Source: Scientometrics

DOI: 10.1007/s11192-015-1786-0

Authors: Jurriën Bakker, Dennis Verhoeven, Lin Zhang, Bart Van Looy

Institutions: KU Leuven, North China University of Water Resources and Electric Power

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Economic and Social Research Council

Awards: G4880584255, 基于混合聚类技术的交叉学科结构特征和演进趋势研究

OpenAlex ID: W1944584271

FWCI: 9.071

Cites: 42

Cited by: 49

Related to: 10