Work

Modeling local and global deformations in Deep Learning: Epitomic convolution, Multiple Instance Learning, and sliding window detection

Year: 2015

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.2015.7298636

Authors: George Papandreou, Iasonas Kokkinos, Pierre-Andre Savalle

Institutions: Google (United States), Institut national de recherche en sciences et technologies du numérique, CentraleSupélec

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Nvidia, Institut national de recherche en informatique et en automatique (INRIA), FP7 Information and Communication Technologies

OpenAlex ID: W1949049686

FWCI: 7.113

Cites: 51

Cited by: 209

Related to: 10