Year: 2015
Type: article
Abstract: We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without installation of additional hardware. The resulting setup allows flexible in situ contacting of samples under UHV conditions and subsequent measurement of the sample topography and local electric potential with resolution down to Å and μV, respectively. The performance of the potentiometry feedback is demonstrated by thermovoltage measurements on the Ag/Si(111)-(√3×√3)R30° surface by resolving a standing wave pattern. Subsequently, the ability to map the local transport field as a result of a lateral current through the sample surface is shown on Ag/Si(111)-(√3×√3)R30° and Si(111) - (7 × 7) surfaces.
Source: Review of Scientific Instruments
DOI: 10.1063/1.4936079
Authors: F. Lüpke, S. Korte, V. Cherepanov, B. Voigtländer
Institution: Forschungszentrum Jülich
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1950496995