Work

Deep LAC: Deep localization, alignment and classification for fine-grained recognition

Year: 2015

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.2015.7298775

Authors: Di Lin, Xiaoyong Shen, Cewu Lu, Jiaya Jia

Institutions: Chinese University of Hong Kong, Hong Kong University of Science and Technology

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: California Institute of Technology, Nvidia, University of California, San Diego

OpenAlex ID: W1955942245

FWCI: 11.59

Cites: 29

Cited by: 355

Related to: 10