Work

A method for quantifying annihilation rates of bulk point defects at surfaces

Year: 2005

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.1946195

Authors: Charlotte T. M. Kwok, Kapil Dev, Richard D. Braatz, E. G. Seebauer

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, U.S. Department of Energy, University of Florida, Lawrence Berkeley National Laboratory

OpenAlex ID: W1963502806

FWCI: 2.047

Cites: 46

Cited by: 22

Related to: 10