Work

Thin film and surface characterization by specular X-ray reflectivity

Year: 1997

Type: article

Source: Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences

DOI: 10.1080/10408439708241258

Authors: E. Chason, T. M. Mayer

Institution: Sandia National Laboratories

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1963945184

FWCI: 13.57

Cites: 196

Cited by: 262

Related to: 10