Work

Fast run-length-based algorithm for one-dimensional flat opening

Year: 1998

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.323467

Authors: Seungchan Kim, Sinan Batman, Edward R. Dougherty

Institution: Texas A&M University

Language: English

Topic: Digital Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1964396993

FWCI: 0.585

Cites:

Cited by: 1

Related to: 10