Work

Lattice distortion analysis of nonpolar a-plane $$(11\bar 20)$$ GaN films by using a grazing-incidence X-ray diffraction technique

Year: 2015

Type: article

Source: Journal of the Korean Physical Society

DOI: 10.3938/jkps.66.607

Authors: Yong Gon Seo, Jihoon Kim, Sung-Min Hwang, Jihyun Kim, Soohwan Jang, Heesan Kim, Kwang Hyeon Baik

Institutions: Korea Electronics Technology Institute, Korea University, Dankook University, Hongik University

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Hongik University, LG Electronics

OpenAlex ID: W1964772556

FWCI: 0.149

Cites: 31

Cited by: 3

Related to: 10