Effects of manufacturing defects on the device failure rate
Work
Year: 2013
Type: article
Author Kyungmee O. Kim
Institution Konkuk University
Cites: 26
Cited by: 11
Related to: 10
FWCI: 3.265
Citation percentile (by year/subfield): 88.74
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed