Work

Total internal reflection holographic microscopy for quantitative phase characterization of cellular adhesion

Year: 2010

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.842470

Authors: William M. Ash III, David Clark, Chun-Min Lo, Myung K. Kim

Institution: University of South Florida

Language: English

Topic: Digital Holography and Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1965209346

FWCI: 1.277

Cites:

Cited by: 2

Related to: 10