Work

Effects of Cu2−xS phase removal on surface potential of Cu2ZnSnS4 thin-films grown by electroplating

Year: 2014

Type: article

Source: Current Applied Physics

DOI: 10.1016/j.cap.2014.09.009

Authors: Gee Yeong Kim, Ju Ri Kim, William Jo, Kee Doo Lee, Jin Young Kim, Trang Thi Thu Nguyen, Seokhyun Yoon

Institutions: Ewha Womans University, Korea Institute of Science and Technology

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1965283977

FWCI: 1.413

Cites: 22

Cited by: 25

Related to: 10