Work

A review of focused ion beam milling techniques for TEM specimen preparation

Year: 1999

Type: article

Source: Micron

DOI: 10.1016/s0968-4328(99)00005-0

Authors: L.A. Giannuzzi, F.A. Stevie

Institution: University of Central Florida

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

Funders: National Science Foundation, National Defense Science and Engineering Graduate

OpenAlex ID: W1966118057

FWCI: 24.9

Cites: 26

Cited by: 1,248

Related to: 10