Building a test collection for complex document information processing
Year: 2006
Type: conference-paper
Authors: D. Lewis, G. Agam, S. Argamon, O. Frieder, D. Grossman, J. Heard
Institution: Illinois Institute of Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1966382373