Work

Mechanical-electrical characterization of carbon-nanotube thin films for structural monitoring applications

Year: 2006

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.658896

Authors: Kenneth J. Loh, Jerome P. Lynch, Nicholas A. Kotov

Institution: University of Michigan

Language: English

Topic: Carbon Nanotubes in Composites

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W1966611660

FWCI: 8.218

Cites: 10

Cited by: 9

Related to: 10