Work

Ultra precision micro-CMM using a low force 3D touch probe

Year: 2005

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.618692

Authors: F. Meli, A. Kueng, R. Thalmann

Institution: Swiss Federal Institute of Metrology

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: École Polytechnique Fédérale de Lausanne

OpenAlex ID: W1966795084

FWCI: 16.05

Cites: 4

Cited by: 155

Related to: 10