Work

Spectroscopic ellipsometry data analysis: measured versus calculated quantities

Year: 1998

Type: article

Source: Thin Solid Films

DOI: 10.1016/s0040-6090(97)00765-7

Author: G.E. Jellison, Jr

Institution: Oak Ridge National Laboratory

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1966845269

FWCI: 8.354

Cites: 51

Cited by: 373

Related to: 10