The Effects of Chemical Oxide on the Deposition of Tungsten by the Silicon Reduction of Tungsten Hexafluoride
Year: 1987
Type: article
DOI: 10.1149/1.2100882
Institutions: Stanford SystemX Alliance, Stanford University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1967348382
