Work

The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS

Year: 2011

Type: article

Source: Journal of Solid State Electrochemistry

DOI: 10.1007/s10008-010-1289-0

Authors: John A. Kilner, Stephen J. Skinner, Hidde H. Brongersma

Institutions: Imperial College London, Eindhoven University of Technology

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1967885359

FWCI: 12.57

Cites: 61

Cited by: 119

Related to: 10