Improved atomic force microscopy resolution using an electric double layer
Year: 1997
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.118221
Institutions: University of Toronto, Royal Ontario Museum
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1968077145