Work

Panoramic scanning and the technological environment

Year: 1984

Type: article

Source: Technovation

DOI: 10.1016/0166-4972(84)90015-4

Author: Rias J. van Wyk

Language: English

Topic: Competitive and Knowledge Intelligence

Subfield: Strategy and Management

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1968805464

FWCI: 9.986

Cites: 23

Cited by: 24

Related to: 10