Pathway Clustering of the Up-regulated Genes in the Stimulated Rice Seedlings that Germinating from the Seeds Implanted by the Low-Energy Nitrogen Ion
Year: 2011
Type: article
Abstract: In order to understand the molecular mechanism of the ion-implantation biological effects, we analyzed genes expression profiles in rice seedlings from the seeds implanted with the nitrogen ion beam, using the Agilent Rice Oligo Microarray (4×44) Genome Array. Rice seeds were implanted by the nitrogen ion beam with 40 Kev energy in dose 6×1017 N+/cm2. Total RNA, from the seedlings 96 h after the germination, was used to genechip analysis. The vigor index was measured at 10days after the germination. The results of measuring of the vigor index showed that smaller-dose implantation of the nitrogen ion beam (6×1017 N+/cm2) promoted the vigor index (P<0.05) of the rice seedlings and the larger-dose implantation(9×1017 N+/cm2) damaged the rice seedlings because of the smaller vigor index than the control (P<0.05). The analysis of the genechip array showed that there are 982 transcripts expressed differentially (fold change > 2 and P value<0.05) including 429 up-regulated transcripts and 553 down-regulated transcripts under the dose3 comparing with the controls. 15 out of the 429 up- regulated transcripts were involved in 22 pathways including carbohydrate metabolism, translation, biosynthesis of secondary metabolites, lipid metabolism, energy metabolism, replication and repair, nucleotide metabolism, signal transduction, folding, sorting and degradation and so on. Our analysis supplied the first comprehensive and comparative molecular information for further understanding the mechanism underlying implantation of the low- energy nitrogen ion beam.
Source: Procedia Environmental Sciences
Authors: Ya Hui-Yuan, Chen Qiu-Fang, Wang Wei-Dong, Qin Guang-Yong, Jiao Zhen
Institutions: Zhengzhou University, Luoyang Normal University
Language: English
Subfield: Plant Science
Domain: Life Sciences
SDG: Zero hunger
Open Access status: diamond
OpenAlex ID: W1968929117
