Work

Valence-band offsets at strained Si/Ge interfaces

Year: 1991

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.44.5572

Authors: L. Colombo, R. Resta, S. Baroni

Institution: Scuola Internazionale Superiore di Studi Avanzati

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1969834715

FWCI: 6.442

Cites: 21

Cited by: 198

Related to: 9