Temperature, stress, and annealing effects on the luminescence from electron-irradiated silicon
Year: 1973
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1662165
Authors: Colin E. Jones, Eric S. Johnson, W. Dale Compton, J. R. Noonan, B. G. Streetman
Institution: University of Illinois Urbana-Champaign
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1969954410