Work

Improved measurement-based modeling of inverted-MSM photodetectors using on-wafer calibration structures

Year: 2004

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.531640

Authors: Cheolung Cha, Jae Hong Kim, Zhaoran Huang, Nan M. Jokerst, Martin A. Brooke

Institutions: Georgia Institute of Technology, Duke University

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Georgia Institute of Technology

OpenAlex ID: W1969973889

FWCI:

Cites: 9

Cited by: 1

Related to: 10