Work

Sparsity-based single-shot sub-wavelength coherent diffractive imaging

Year: 2012

Type: conference-paper

Source: IEEE Convention of Electrical and Electronics Engineers in Israel

DOI: 10.1109/eeei.2012.6376969

Authors: Yoav Shechtman, Alexander Szameit, Elad Bullkich, Oren Cohen, Mordechai Segev, Elyahu Osherovich, Irad Yavneh, Michael Zibulevsky, Yonina C. Eldar, Hod Dana, Shy Shoham

Institution: Technion – Israel Institute of Technology

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1971663181

FWCI: 0.831

Cites: 16

Cited by: 2

Related to: 10