Work

Crystal Structure Analysis of the Mg2Si1-xSnx System Having Potential Thermoelectric Properties at High Temperature

Year: 2011

Type: article

Abstract: Laves phases of C15 type of the system Mg2Si1-xSnx with x = 0, 0.4, 0.6 and 1 were synthesized in polycrystalline state in tantalum ampoule heated by high frequency coupling. The as-cast materials were analysed first at room temperature by X-ray diffraction (XRD). Systematically, XRD patterns were recorded up to 700 °C and Differential Scanning Calorimetry analysis was performed up to 1200°C to control the chemical and structural phase transformations. From these experiments, a C15 to C36 structure transformation was pointed out around 600°C in Mg2Si1-xSnx.solid solutions.

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/www.scientific.net/ssp.170.253

Authors: D. Boudemagh, Daniel Fruchart, R. Haettel, El Kebir Hlil, A. Lacoste, L. Ortega, N.E. Skryabina, Janusz Toboła, Pierre Wolfers

Institutions: Institut Néel, Centre National de la Recherche Scientifique, Université Joseph Fourier, Laboratoire de Physique Subatomique et de Cosmologie, AGH University of Krakow

Language: English

Topic: Advanced Thermoelectric Materials and Devices

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1971974670

FWCI: 0.277

Cites: 19

Cited by: 13

Related to: 10