Work

On the Factors Affecting the Contrast of Height and Phase Images in Tapping Mode Atomic Force Microscopy

Year: 1997

Type: article

Source: Langmuir

DOI: 10.1021/la970822i

Authors: R. Brandsch, G. Bar, M.-H. Whangbo

Institution: North Carolina State University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1973058927

FWCI: 10.06

Cites: 30

Cited by: 164

Related to: 10