X-ray imaging with a charge-coupled device fabricated on a high-resistivity silicon substrate
Year: 1981
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.92561
Authors: M. C. Peckerar, D. H. McCann, Leepo Yu
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1973060058