Work

Optimal schemes for resubmitted lot acceptance using previous defect count data

Year: 2015

Type: article

Source: Computers & Industrial Engineering

DOI: 10.1016/j.cie.2015.04.015

Author: Arturo J. Fernández

Institution: Universidad de La Laguna

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1973514530

FWCI: 1.822

Cites: 27

Cited by: 13

Related to: 10