Work

A fundamental parameters approach to X-ray line-profile fitting

Year: 1992

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889891010804

Authors: R. W. Cheary, A. Coelho

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1973518565

FWCI: 4.234

Cites: 4

Cited by: 1,660

Related to: 10