Work

High-density electron-beam-fabricated CCD memory components

Year: 1980

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1980.20084

Authors: J.M. Hamilton, J.G. Nash, R.C. Henderson, J.Y. Chen, D.M. Leong, N. Cuk

Institutions: Hughes Aircraft (United States), HRL Laboratories (United States)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1974076519

FWCI: 1.704

Cites: 12

Cited by: 5

Related to: 10