Work

Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

Year: 2010

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s002188981003027x

Authors: Florian Bachmann, Ralf Hielscher, Peter E. Jupp, Wolfgang Pantleon, Helmut Schaeben, Elias Wegert

Institutions: TU Bergakademie Freiberg, Chemnitz University of Technology, University of St Andrews, Technical University of Denmark

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1975206388

FWCI: 1.696

Cites: 37

Cited by: 141

Related to: 10