Work

Drain voltage sweeping-induced degradation in n-type low-temperature polysilicon thin film transistors

Year: 2010

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/0268-1242/25/4/045022

Authors: Dapeng Zhou, Mingxiang Wang, Han Hao, Dongli Zhang, Man Wong

Institutions: Soochow University, Hong Kong University of Science and Technology

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Jiangsu Province

OpenAlex ID: W1975652497

FWCI:

Cites: 10

Cited by: 1

Related to: 10