Screening Synchronously Occurred Multiple Abnormal Quality Characteristics in a Silicon Wafer Slicing Process
Year: 2002
Type: article
Source: Asian Journal on Quality
Authors: Chin‐Tsai Lin, Chie‐Bein Chen, Che‐Wei Chang
Institutions: National Dong Hwa University, Ming Chuan University
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W1975972969